Proceedings of JSPE Semestrial Meeting
2008 JSPE Autumn Conference
Session ID : D14
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Development of a standard scale calibrator for low uncertainty of measurement
Second Report: Uncertainty factors resulting from Optical Systems
*Akira TakahashiYuichi TakigawaNobuharu Miwa
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract

Precision line scales are widely used for calibration of measuring instruments. A one-dimensional calibration system for line scales has been developed. The calibration system, SSC-05, consists of a moving microscope that detects the graduations on the line scale under test. The laser source for the interferometer systems of SSC-05 is calibrated in real time by an iodine stabilized He-Ne laser. In this report, uncertainty factors resulting from optical systems are discussed after briefly introducing the calibration system.

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© 2008 The Japan Society for Precision Engineering
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