Host: The Japan Society for Precision Engineering
Precision line scales are widely used for calibration of measuring instruments. A one-dimensional calibration system for line scales has been developed. The calibration system, SSC-05, consists of a moving microscope that detects the graduations on the line scale under test. The laser source for the interferometer systems of SSC-05 is calibrated in real time by an iodine stabilized He-Ne laser. In this report, uncertainty factors resulting from optical systems are discussed after briefly introducing the calibration system.