Proceedings of JSPE Semestrial Meeting
2008 JSPE Spring Conference
Session ID : M38
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Host: The Japan Society for Precision Engineering

Development on in-situ measurement for selforganization process of nano particles using multi spot fluorescence polarization method
*Terutake Hayashi, Yasuhiro Takaya, Satoshi Ota
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Keywords: self-organization, fluorescence polarization, LCD
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[in Japanese]
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© 2008 The Japan Society for Precision Engineering
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