Proceedings of JSPE Semestrial Meeting
2009 JSPE Spring Conference
Session ID : A20
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The study about the transport phenomenon of slurry and heat on CMP
*Makoto ImajoKatsuya NagayamaKeiichi KimuraKazuki Ueno
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Keywords: CMP, slurry, pad
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Abstract
CMP is a planarization technology of polishing chemical and mechanical action, and it is mainly used for the wafer for the main board of semi-conductor. The friction between wafer and pad generates the heat in CMP process, and it affects on polishing the wafer uniformly. In this study, we analyzed the transport of slurry and heat and we made the phenomenon clear.
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© 2009 The Japan Society for Precision Engineering
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