Abstract
Temporal carrier technology is introduced to electronic speckle interferometry in order to produce virtual speckle patterns. Then, dynamic deformation measurement with a large deformation is performed by using virtual speckle pattern. However, in this method, it takes a long calculating time to make virtual speckle patterns, because the temporal carrier analysis is performed in each pixel of CCD. In this proposed method, virtual speckle patterns are produced without temporal carrier analysis. Then, Carre algorithm is employed. As the results, the calculating cost is improved remarkably and the high measurement accuracy is realized.
