2012 JSPE Autumn Conference
Session ID : F01
Conference information
Host: The Japan Society for Precision Engineering
Development of high-resolution hard X-ray microscopy based on Advanced Kirkpatrick-Baez optics
*Satoshi Matsuyama, Yoji Emi, Yasuhisa Sano, Yoshiki Kohmura, Tetsuya Ishikawa, Kazuto Yamauchi
Author information
Details
