Abstract
We have been studied optical active notch (band-cut) filter at visible region assisted by surface plasmon resonance (SPR) in meta-insulator-metal (MIM) structure of evaporated thin films on glass substrate both experimentally and theoretically. Since the last report of us in spring meeting, evaluation instrumentation for the spectral reflectance has been improved, and a dedicated vacuum evaporation system has been introduced to this study. Effect of exposure to the atmosphere during the thin film depostion is eliminated now because the whole evaporation process for the MIM structure is under high vacuum around 1E-4 Pa. In this talk, the advanced and polarization-dependent data on spectral reflectance will be presented and discussed with numerical simulations.