Proceedings of JSPE Semestrial Meeting
2012 JSPE Spring Conference
Session ID : M38
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Host: The Japan Society for Precision Engineering

Interferometric Measurement of Thickness using Pico-second Pulse Laser
*Ohma Nakajima, Yoshihiro Oshida
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Keywords: Pico-second pulse laser, Interferometry, Measurement of Thickness
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[in Japanese]
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© 2012 The Japan Society for Precision Engineering
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