Proceedings of JSPE Semestrial Meeting
2015 JSPE Autumn Conference
Session ID : E64
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Host: The Japan Society for Precision Engineering

Imaging of charged samples using scanning ion conductance microscopy
*Yusuke Eguchi, Kimihiro Ishizaki, Masato Nakajima, Tatsuo Ushiki, Futoshi Iwata
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Keywords: Scanning ion conductance microscope, PDMS
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[in Japanese]
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© 2015 The Japan Society for Precision Engineering
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