Abstract
A computed tomographic measurement based in sensing the introduced phase changes of a transparent sample is implemented. The interferometry system is composed by a Polarizing Michelson interferometer coupled to a pixelated camera in order to acquire the necessary phase shifted interferograms instantaneously. By obtaining measurements at different angles of rotation, added with computed tomographic algorithms, inner information of the sample is obtained. Characteristics and limitations of the implemented system will be explained and experimental results showing the inner distribution phase change of a high temperature torch will be presented.
