Proceedings of JSPE Semestrial Meeting
2015 JSPE Spring Conference
Session ID : K03
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Development of Underwater Atomic Force Microscopy for Observation of Micro Samples Existed in Deep-sea. (the Second Report)
Imaging of Micro Samples Using a Self-sensitive Cantilever Coated with Parylene
*Naoki MatsubaraShuhei NishidaTatsuhiro FukubaHaruyuki KinoshitaMasanori KyoTeruo Fujii
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CONFERENCE PROCEEDINGS FREE ACCESS

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[in Japanese]

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© 2015 The Japan Society for Precision Engineering
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