Proceedings of JSPE Semestrial Meeting
2016 JSPE Autumn Conference
Session ID : M04
Conference information

Host: The Japan Society for Precision Engineering

Name : 2016 JSPE Autumn Conference

Location : [in Japanese]

Date : September 06, 2016 - September 08, 2016

Imaging of charged samples using scanning ion conductance microscopy with a theta type pipette probe
*Tatsuru Shirasawa, Yusuke Eguchi, Yusuke Mizutani, Tatsuo Ushiki, Futoshi Iwata
Author information
Keywords: Scanning Ion Conductance Microscopy, charged sample
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Abstract
[in Japanese]
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© 2016 The Japan Society for Precision Engineering
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