Proceedings of JSPE Semestrial Meeting
2016 JSPE Autumn Conference
Session ID : M34
Conference information

Host: The Japan Society for Precision Engineering

Name : 2016 JSPE Autumn Conference

Location : [in Japanese]

Date : September 06, 2016 - September 08, 2016

Extraction of surface thin stains using Fourier transform
*Yasuhiko Hara, Hirotaka Tanaka, Kenji Shirai, Yoshinobu Takizawa, Junichi Sugano
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Keywords: Extraction of surface thin stains, Fourier transform, Inspection, AOI, Image processing
CONFERENCE PROCEEDINGS FREE ACCESS

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[in Japanese]
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© 2016 The Japan Society for Precision Engineering
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