Expansion of measurement area of three-dimensional deformation measurement speckle interferometry with same sensitivities in three directions under consideration of measurement sensitivity

Abstract

A novel in–plane and out–of–plane deformation simultaneous measurement method using only two speckle patterns grabbed before and after deformation of an object with rough surfaces has been proposed. In the new optical system, a phenomenon of in–plane and out–of–plane deformation can be simultaneously recorded by only one camera by using the multi–recording technology of speckle patterns. Furthermore, the same measurement sensitivities in three directions can be set in this system. In this paper, expansion of measurement area of the method is discussed under consideration of measurement sensitivity. The situation of measurement accuracy in extending of measurement area is investigated.