Proceedings of JSPE Semestrial Meeting
2020 JSPE Spring Conference
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High precision measurement of etalon optical length using pulsed interferometry
Evaluation of temperature characteristics
*Shusei MasudaTomohiko TakamuraSatoru TakahashiHirokazu MatsumotoKiyoshi Takamasu
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Keywords: optical comb, etalon
CONFERENCE PROCEEDINGS FREE ACCESS

Pages 632-633

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[in Japanese]
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© 2020 The Japan Society for Precision Engineering
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