Inspection of Quartz Device by the MTS Method
2001 Volume 9 Issue 2 Pages 56-62
Details
2001 Volume 9 Issue 2 Pages 56-62
In this paper, an application of the MTS method for the appearance inspection of quartz devices. Appearance was transformed by a CCD camera into image concentration. Good quality quartz devices were selected to form a base space. The items to be used to construct the base space were studied and then altered. It was concluded that the MTS method can be used for the appearance inspection of quartz devices.
