Abstract
The operating window method is a novel tool which reduces two defect modes with a tradeoff relationship by assigning an operating window factor to the outer array. However, there are more than one tradeoff relationships in general. In this article, we consider two tradeoff relationships with four kinds of defect modes. The design of experiment using two operating window factors and the analysis of experimental observations are proposed. In practice, the proposed method is applied to a circuit design. As a result, we can find the optimal design condition which reduces four defects simultaneously.
