Journal of The Japanese Society for Quality Control
Online ISSN : 2432-1044
Print ISSN : 0386-8230
Invited Article
Highly Reliable System Development Using FRAM
Hideki NOMOTO
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2020 Volume 50 Issue 3 Pages 192-197

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Abstract

 In this paper, methodology of developing highly reliable system using FRAM (Functional Resonance Analysis Methodology) is described. Increase of IoT or AI applications for the safety critical systems such as self-driving car is changing the system engineering. The main factor of the change is that the system itself is beginning to have capability to adopt to environment change by IoT or machine learning. In this situation, the need for the new way of system engineering is getting attention, especially for the system which has great flexibility to cope with the changing environment. FRAM is the methodology to model how each function is connected and interacting with each other to cope with the changes.

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© 2020 The Japanese Society for Quality Control
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