The Temperature Dependece of Relaxation of Resistive Memory Effect in a Metal/PLZT Thin Film

Kazumasa Yamada; Shigeru kaku; Mizuki Yamato; Daisuke Matsumoto; Yukio Watanabe

doi:10.11533/rcbjsf.2006.0.111.0

Abstract book of the 8th Russia/CIS/Baltic/Japan Symposium on Ferroelectricity

Session ID : PA-28

DOI https://doi.org/10.11533/rcbjsf.2006.0.111.0

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Host: Organizing Committee of the 8th Russia/CIS/Baltic/Japan Symposium on Ferroelectricity

Co-host: Graduate School of Pure and Applied Sciences, University of Tsukuba, The Physical Society of Japan, The Japan Society of Applied Physics, Taylor & Francis Group, The Murata Science Foundation

The Temperature Dependece of Relaxation of Resistive Memory Effect in a Metal/PLZT Thin Film

*Kazumasa Yamada, Shigeru kaku, Mizuki Yamato, Daisuke Matsumoto, Yukio Watanabe

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