The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
VLSI High-order Composition considering Test Easiness
Michiko Inoue, Hideo Fujiwara
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1998 Volume 20 Issue 5 Pages 333-340

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[in Japanese]

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© 1998 Reliability Engineering Association of Japan
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