The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
Reliability Study of InP HFETs(Reliability of Optical Devices and Parts)
Yoshino K. FUKAI, Takashi MAKIMURA, Haruki YOKOYAMA, Suehiro SUGITANI, Kouichi MURATA, Takatomo ENOKI, Yasuro YAMANE
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2002 Volume 24 Issue 8 Pages 673-681

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[in Japanese]
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© 2002 Reliability Engineering Association of Japan
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