The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
Sequential D-Optimal Design for Binary Lifetime Testing on Weibull Distribution
Wataru YAMAMOTODaisuke IWAMOTOHirokazu YASUDAKazuyuki SUZUKI
Author information
JOURNAL FREE ACCESS

2003 Volume 25 Issue 1 Pages 75-87

Details
Abstract
When products under lifetime testings need destructive investigations, the data sets consist of binary values observed only at times prespecified for each item. Iwamoto and Suzuki [6] derives a D-optimal design of inspection times for several lifetime distributions, that is almost optimal when close initial estimates are available. This article extends that design to multistage cases so as to examine the influences of initial estimates on maximum likelihood estimates. A conditionally D-optimal design is proposed which determines inspection times sequentially for multistage testings. Weibull distributions with known shape parameters are numerically investigated for biases and variances of maximum likelihood estimators. Small sample properties of maximum likelihood estimators and the properties of equally allocated designs are also investigated. These results suggest that when the initial estimates are set to be smaller than the true values, multistage testings work well and maximum likelihood estimates are obtained. Also, the single stage design is nearly optimal for cases with the shape parameter is less than or equal to 1.0. This means if we have such initial estimates, one stage testings give results with reasonable precisions.
Content from these authors
© 2003 Reliability Engineering Association of Japan
Previous article Next article
feedback
Top