The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
The Latest SOI Device Technology and its Reliability(Advanced LSI Technology and its Reliability)
Toshiyuki TSUTSUMI
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2007 Volume 29 Issue 4 Pages 226-233

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[in Japanese]

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© 2007 Reliability Engineering Association of Japan
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