The Journal of Reliability Engineering Association of Japan
Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697
Special Survey “Development of New and High Functional Semiconductor Materials and Devices and Reliability Analysis Technology”
Possibility of Gallium Oxide Power Devices
Masataka HIGASHIWAKI
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2020 Volume 42 Issue 5 Pages 235-240

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[in Japanese]
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© 2020 Reliability Engineering Association of Japan
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