Proceeding of Symposium on Reliability
Online ISSN : 2424-2357
ISSN-L : 2424-2357
2012Spring.20
Session ID : 1-3
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1-3 A Study on Soft-Error Hardening for SOI Devices
*S. OGURA, Y. TAKAHASHI, T. MAKINO, S. ONODA, T. HIRAO, T. OHSHIMA
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Abstract
[in Japanese]
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© 2012 Reliability Engneering Association of Japan
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