Proceeding of Symposium on Reliability
Online ISSN : 2424-2357
ISSN-L : 2424-2357
2015Spring.23
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1-2 A Study of Method for Identifying RF-Tags under Bit Slips
*Yoichi SUGIYAMA, Mitsuyoshi FUKUDA, Takayasu KITANO
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 11-14

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© 2015 Reliability Engneering Association of Japan
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