Proceeding of Symposium on Reliability
Online ISSN : 2424-2357
ISSN-L : 2424-2357
2015Spring.23
Conference information
2-1 Reduction of Radiation Induced Parasitic Bipolar effects by Tunnel FET
*Yan WU, Y. TAKAHASHI
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Pages 25-26

Details
Download PDF (288K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Abstract
[in Japanese]
Content from these authors
© 2015 Reliability Engneering Association of Japan
Previous article Next article
Favorites & Alerts

Recently viewed articles
Share this page
feedback
 Top