Proceeding of Symposium on Reliability
Online ISSN : 2424-2357
ISSN-L : 2424-2357
[volume title in Japanese]
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Date : November 06, 2020 -

1-4　Initiatives for Optimal Evaluation of Nonvolatile Memory
～Application example of JESD219A to SD card～
*Makoto NAGANO, *Takenori KOZEKI, *Yasushi DEGUCHI, *Katsuhiro KATO, *Yasuo IMAI
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Pages 37-

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