[volume title in Japanese]
Conference information
Name : [in Japanese]
Date : November 06, 2020 -
2-3 Verification of Effectiveness of non-Destructive Analysis Using GaN Device Tested by Thermal Shock
*Yusuke FUJISAWA, *Noboru YAKUMARU, *Hiroyuki MURATA, *Saki MIKAMI, *Keisuke FUCHIGAMI, *Naoki AZUMA, *Yutaka IKEMOTO, *Hideharu TSUCHIYA
Author information
Pages 51-
Details
Article 1st page
