Evaluation of Microstructure by Precise Measurement of Resistivity in Pure Ti

Abstract

Several metallic materials have been developed for many purposes by alloying and controlling microstructure. From the viewpoint of materials recycling, several properties should be controlled by the latter in simple alloys. The purpose of this work was to establish a method for evaluating microstructure in metallic materials by a precise measurement of electrical resistivity. Electrical resistivities at 77 K and 300 K were measured by a direct current four-point method in commercially purity titanium plates after tensile deformations. The resistivities basically increased by the deformations. The Matthiessen’s plot shows good linearity. Microstructure might be potentially evaluated by this method.