Generation Mechanism of Localized Wear of Cu-impregnated Metalized Carbon Contact Strip

Abstract

Localized wear on pantograph contact strips is a serious issue that needs to be addressed urgently, as it can cause the pantograph head to fuse and the overhead contact wire to break. However, the exact causes of localized wear are still unclear, and effective solutions have not yet been developed. This study aims to identify the causes of localized wear in copper-impregnated metalized carbon contact strips. To achieve this, worn strips were analyzed using a micro-Raman spectrometer and the sliding wear behavior of contact strips with different levels of carbon graphitization was examined using a block-on-ring wear tester.