Abstract
Contemporary the Sachs-Le Docte method for sugar components measurement of sugar beet is used, but it is time-consuming and expensive. In this study, the potential of near infrared reflectance spectroscopy in measuring the sugar components has been investigated. For calibration and validation, correspondingly, were used 30 samples of sugar beets, variety “Monohomare”, produced in Hokkaido, Japan. The spectra of the samples were measured through the cutting surface of beets over a wavelength range of 800-1100nm. As a result, it was found that the standard error of NIR method was about 0.8%.
