Abstract
This report describes a new microscopy technique, which probes spontaneous emission from samples with nanoscale spatial resolution. We have developed a passive THz near-field microscope by introducing an ultrahighly sensitive THz detector (CSIP) and a scattering-type scanning near-field optical microscope. Here we show a result, which probes THz evanescent waves with 60 nm resolution with our microscope. Finally we also show nano-thermometory as an application.
