Abstract
The effect of saccharin on the stress of Ni electroforming from high concentration Watt's dath, is studied by spiral contructometer and X-ray diffraction method.
As the concentration of saccharin is increased (0 to 100mg/l), the stress measured with spiral contructometer, is changed from tensile to compressive stress, whereas the half-peak breadth of X-ray diffraction line is increased, but with a further increase of saccharin concentration (100 to 1, 000mg/l), the stress and half-peak breadth are almost unchanged,
The crystal size measured by electromicroscopy and X-ray diffraction techniques are about 1 to 5 microns, and the increase of X-ray line breadth seems to be due to strain of crystals.
