Journal of The Society of Instrument and Control Engineers
Online ISSN : 1883-8170
Print ISSN : 0453-4662
ISSN-L : 0453-4662
Survey
Review on Metrological Traceability
Hidetoshi NAKANO
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Keywords: metrological traceability, SI: International System of Units, convention of the meter, JCSS: Japan Calibration Service System
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2009 Volume 48 Issue 4 Pages 300-305

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© 2009 The Society of Instrument and Control Engineers
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