Journal of The Society of Instrument and Control Engineers
Online ISSN : 1883-8170
Print ISSN : 0453-4662
ISSN-L : 0453-4662
Test Technology for Custom LSI
Hideo FUJIWARA
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Keywords: testing, test generation, fault simulation, design for testability, built-in self test
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1989 Volume 28 Issue 10 Pages 876-881

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