Journal of The Society of Instrument and Control Engineers
Online ISSN : 1883-8170
Print ISSN : 0453-4662
ISSN-L : 0453-4662
Microscope for Direct Measurements of Nanoscale Properties: Multi-tip Scanning Tunneling Microscope
Tomonobu NAKAYAMAChun-Sheng JIANGTaichi OKUDAMasakazu AONO
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1999 Volume 38 Issue 12 Pages 742-746

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