Journal of The Society of Instrument and Control Engineers
Online ISSN : 1883-8170
Print ISSN : 0453-4662
ISSN-L : 0453-4662
Scanning Near-Field Optical Microscopy
Norihiro UMEDA, Shin-ya OHKUBO
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Keywords: scanning probe microscope, near-field optics, optical probe, birefringence, friction transfer
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1999 Volume 38 Issue 12 Pages 752-757

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