Calibration and Characterization of 650 nm Silicon Narrow-band Radiation Thermometer

Abstract

This paper describes the calibration and characterization of the 650 nm standard radiation thermometers used in the traceability system of radiation thermometers in Japan. NMIJ started in 2001 a new calibration service including the copper-point calibration, spectral responsivity and nonlinearity measurement. Characterization covers the size of source effect, distance effect, ambient temperature dependence, zero offset drift and long term stability.