SICE Annual Conference Program and Abstracts
SICE Annual Conference 2002
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Polymer micro cantilevers for force controlled atomic force microscopy 2
—Fabrication of cantilevers—
Nobuhiro KatoChoong Sik ParkToshiro MatsumotoHisao KikutaKoichi Iwata
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 223

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Abstract

The micro cantilever made of entirely plastic material has been developed. The probing tip, cantilever and base are made of same photo plastic. By arranging the geometry of the cantilever, its spring constant and resonant frequency is controlled. The low Q of the polyimide improves the stability of the force controlled atomic force microscope. The fabrication error in cantilever geometry was 1.5%. The estimated resonant frequency has a good agreement with the designed value.

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© 2002 SICE
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