Fault Diagnosis in a Class of Concurrent Discrete Event Systems

Yoshitaka Ukawa; Toshimitsu Ushio; Shigemasa Takai; Shigeru Yamamoto

doi:10.11499/sicep.2003.0_108_2

SICE Annual Conference 2003

DOI https://doi.org/10.11499/sicep.2003.0_108_2

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Host: The Society of Instrument and Control Engineers

Co-host: The IEEE Industrial Electronics Society, The IEEE Robotics and Automation Society, The IEEE Control Systems Society, The IEEE Systems, Man nad Cybernetics Society, The Instrumentation, Systems, and Automation Society

Fault Diagnosis in a Class of Concurrent Discrete Event Systems

*Yoshitaka Ukawa, Toshimitsu Ushio, Shigemasa Takai, Shigeru Yamamoto

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