On the distribution of the coefficients of variation of the raw silk size in electronic testing

Abstract

For the electronics testing of the raw silk size, we discussed the distribution characteristic of coefficients of variation of raw silk size. As we know, the size of the raw silk tested with electronic testing machine is a continuous sample. Due to the continuity of the size, the characteristics of the continuous size will be different from that of the random sample. In this paper we first gave the distribution of the coefficients of variation of the raw silk size of random testing, then deduces the distribution of coefficient of variation of continuous testing through introducing a equivalent model to random testing, which provides a theoretical basis for the development of electronic testing standard.