The Journal of Silk Science and Technology of Japan
Online ISSN : 1881-1698
Print ISSN : 1880-8204
ISSN-L : 1880-8204
Electronization of test for cleanness and neatness or evenness variation on raw silk.
YOSHIO ISHIGUROTAKEO KOUZUSHOEI ISHII
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1993 Volume 2 Pages 31-37

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Abstract

  The test of cleanness and neatness or evenness variation for raw silk has been currently made through eye-check on seriplain panels. However, there are many problem matters such as maintaining the objectivity of inspection, training of inspectors, require many persons for this testing etc. on the other hand. The alternative means with electronics technology has been required for the improvement on this kind of test.
  For example of alternative means, semiconductor laser sensor has been used for the test of cleanness and neatness, and the device with CCD line sensor has been worked out for the test of evenness variation. The probability of turning to practical use on those devices was obtained through comparing the new method to the current test method (eye-check on seriplane panels) with repeat of needed experiments.
  The research is now on the way to the goal of turning the devices to practical use with improving the test accuracy and the collecting method of sample skeins.

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© 1993 by The Japanese Society of Silk Science and Technology
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