Proceedings of the ISCIE International Symposium on Stochastic Systems Theory and its Applications
Online ISSN : 2188-4749
Print ISSN : 2188-4730
The 35th ISCIE International Symposium on Stochastic Systems Theory and Its Applications (Oct. 2003, Ube)
Identification of Defect Profiles using a Inspection Model and Informative Distributions
Fumio KOJIMAShingo KAMEZAKI
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2004 Volume 2004 Pages 235-240

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Abstract
In this paper, an idea on Markov chain Monte Carlo (MCMC) methodology is applied to inverse analysis for a defect profile identification arising in nondestructive test. A inverse analysis is formulated as a reconstruction of parameters related to material damages. A directed acyclic graph is represented by a linear system for inspection procedures and by a statistical model associated with unknown parameters and testing source inputs. A method for estimating the material parameter is proposed based on the Gibbs sampler. Results of simulation experiments to demonstrate the efficacy of the proposed algorithm are reported.
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© 2004 ISCIE Symposium on Stochastic Systems Theory and Its Applications
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