Abstract
The application of secondary ion mass spectrometry to the analysis of trace elements in kitchen salts using Cs+ as the primary ion to detect negative secondary ions has been studied. The following results were obtained.
1) The secondary ionic species derived from sodium chloride matrix and sea salt compounds and their relative ion intensities were defined.
2) The relative ion intensities of halogen elements, carbon, oxygen, phosphorus and sulfur were high.
3) The detection limits of the elements with high relative ion intensities were low.
4) The quantitative analysis of fluorine, bromine, iodine and phosphorus was carried out by the calibration curve method. Although the analytical values of SIMS differed little from those from usual methods, fluorine, iodine and phosphorus could be analyzed at levels which could not be detected by the ion chromatography.
