High-resolution imaging of carbon materials by TEM and STEM

Abstract

The transmission electron microscope (TEM) and the scanning transmission electron microscope (STEM) are a powerful tool to understand the local structures and properties of carbon materials. The overall property of a material strongly depends on its local structures. However, the technique has not been used as efficiently as possible compared to XRD and spectroscopy. In this review, the development of spatial resolution and a method for adjusting the electron beam for high-resolution observation are briefly introduced as well as recent studies using the technique.