2004 Volume 2004 Issue 213 Pages 144-150
The analysis method for the distribution of carbon layer size proposed by Diamond was modified by being combined with the newly developed techniques in the field of X-ray crystallography, so that it was applicable for every carbon material. Each step of the method was examined in detail. As a result, the analysis precision and reliability were enhanced, and the 11 band profile, including the background and impurity peak profiles, was fitted fairly well.