Applicability Limit of X-ray Line Profile Analysis for Curved Surface by Micro-focus XRD

Abstract

X-ray Line Profile Analysis (XLPA) is a powerful and convenient method to investigate dislocation density, crystallite size and nature (screw or edge) and arrangement of dislocation in a material. However, few studies have been done concerning the application limit of dislocation density measurements for localized regions or curved materials. In this study, X-ray Diffraction measurements of iron powders formed into flat plates and cylinders were performed using the micro-focus method, and XLPA was performed. As a result, it was found that almost the same dislocation density as that of the Bragg-Brentano method could be derived for the flat specimen by micro-focus method, and that the dislocation density of the cylindrical specimen was almost the same as that of the flat specimen up to a radius in 10 mm.