Tetsu-to-Hagane
Online ISSN : 1883-2954
Print ISSN : 0021-1575
ISSN-L : 0021-1575
Regular Article
Chemical State Analysis of Fine Particles using XAFS
Satoshi MATSUMOTOHideshi ISHIITeruo TANABEJun KAWAI
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2007 Volume 93 Issue 2 Pages 132-137

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Abstract

The measurement of X-ray absorption fine structure (XAFS) spectra of fine particle samples using the total electron yield and X-ray fluorescence yield methods reveals the chemical state of surface and bulk, separately, of powder samples. For various particulate environmental samples (both standard samples and sampled in the fields) are measured and the chemical state analysis of sulphur has been performed in the present study. The difference among the samples collected at a same place/date and the similarity among the samples collected at the different places/date are discussed from the view point of the error introduced in the present experiment.

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© 2007 The Iron and Steel Institute of Japan
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