Development of Fast Texture Mapping System with Energy Dispersive X-ray Diffraction Method

Abstract

Texture mapping apparatus with energy dispersive X-ray diffraction method has been newly developed. A collimated white X-ray beam in the diameter of 0.1 to 2.0 mmφ was irradiated to a sample in a fixed incidence and the energy spectrum of diffracted X-ray was measured by solid state detector. In this apparatus, fast data transfer system from multi-channel analyzer to computer was adopted to reduce the total measuring time. Sample was mounted on X-Y stage and moved successively to obtain the intensity mapping of diffraction peaks. Some examples are demonstrated in order to show the performance of this apparatus. It is suitable for the analysis of local inhomogeneities of texture, such as colonies of grains in polycrystalline materials.