Latest advancement of EBSD

Abstract

A new indexing method of EBSD patterns, Spherical Index, has been developed recently. The basic idea of the Spherical Index is based on pattern matching between simulated pattern and experimentally acquired EBSD pattern. The algorithm employs a spherical master simulated EBSD pattern and computes its cross-correlation with a back-projected experimental pattern to find its orientation and phase. The features of spherical index are robust indexing of very noisy EBSD pattern, high angular resolution, and good phase discrimination compared with the present index method by using Hough transformation. These features of Spherical Index are explained in detail. Then the results of EBSD scan of a titanium bolt sample indexed by Spherical Index method are shown.